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立仪点光谱共焦位移传感器涵盖四大类控制器、八大类测量探头系列,可对透明、高反射和各种复杂材料进行非接触式高精度的尺寸、形貌与缺陷检测,无惧各种材质、形状,是工业在线应用的理想选择
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Ceramic sleeve is a key component in optical fiber conn
The size deviation between the key hole depth and the
Inaccurate dimensions of the Lithium Battery pool modul […]
Medical catheters are usually co-extruded from multiple […]
Precision sheets have strict requirements on flatness, […]
The thickness change after the glue is cured will affec
Coated Glass such as Low-E and AR have extremely high
Small defects such as scratches, dents, and residual co […]
In the wafer manufacturing and thinning process, the ov […]
A large number of precision Optics brackets are used in
Excessive differences in appearance structure will affe […]
Uneven electrolyte filling will lead to uneven chemical […]
Contact lenses have extremely high requirements for cen […]
The thickness of the silicon wafer directly affects the […]
Complex trajectory dispensing requires high consistency […]
Highly reflective or highly transparent glass can easil […]
High-gloss copper or plated surfaces reflect strongly t […]
Wafers are prone to warping due to thermal stress and
Optical coatings such as antireflection coatings and re […]
The center thickness of the Optics lens directly affect […]
The connection between the Lithium Battery cell casing […]
The outer diameter, needle tip height and coaxiality of […]
Excessive wafer warpage and total thickness variation ( […]
Glue spillage can cause contamination and assembly risk […]
立仪科技四大控制器系列、八大测量探头系列均可任意组合搭配。 如需更多选型建议或定制化方案,欢迎联系我们。