Meet LightE at OVC EXPO 2026 Wuhan for Semiconductor Precision Inspection

Exhibition Invitation

OVC EXPO 2026 will be held from May 18 to 20, 2026, at the China Optics Valley Convention and Exhibition Center in Wuhan. Under the theme of optoelectronic innovation, the exhibition covers laser technology, optical communication, optical inspection, semiconductor manufacturing, and related industrial chains.

LightE sincerely invites customers and partners to visit Booth A306 in Hall A3 to discuss semiconductor precision inspection and the development of optical measurement applications.

Meet LightE at OVC EXPO 2026 Wuhan for Semiconductor Precision Inspection
Meet LightE at OVC EXPO 2026 Wuhan for Semiconductor Precision Inspection

Products and Solutions

LightE will bring high-precision chromatic confocal displacement sensors and application solutions for semiconductor and optoelectronic inspection. Typical applications include wafer thickness and TTV, glass substrate flatness, optical module height, microstructure measurement, and precision dispensing guidance.

The system offers non-contact measurement, high resolution, and strong adaptability to transparent, reflective, mirror-like, and complex material surfaces.

Meet LightE at OVC EXPO 2026 Wuhan for Semiconductor Precision Inspection

Technical Consultation

Our engineering team will be on site to provide model selection support, application analysis, and sample testing consultation. We look forward to meeting you in Wuhan and exploring how optical measurement can support process stability and yield improvement.

Meet LightE at OVC EXPO 2026 Wuhan for Semiconductor Precision Inspection
Meet LightE at OVC EXPO 2026 Wuhan for Semiconductor Precision Inspection
Meet LightE at OVC EXPO 2026 Wuhan for Semiconductor Precision Inspection
Meet LightE at OVC EXPO 2026 Wuhan for Semiconductor Precision Inspection
Meet LightE at OVC EXPO 2026 Wuhan for Semiconductor Precision Inspection