Exhibition Review
From May 13 to 15, 2026, the 8th Global Semiconductor Industry Expo (Chongqing) was held at Chongqing International Expo Center. LightE presented high-precision chromatic confocal displacement sensors and discussed precision inspection innovation with semiconductor companies from across China.
Focused on Semiconductor Inspection
During the exhibition, LightE received visitors from semiconductor equipment manufacturers, research institutes, and universities. The team demonstrated real-time thickness measurement, flatness measurement, and other optical inspection solutions, while discussing customized approaches for specific process pain points.
With semiconductor localization accelerating, high-precision and high-stability inspection equipment is becoming a core requirement. LightE continues to pursue independent R&D and domestic substitution, providing reliable measurement components for advanced semiconductor manufacturing.
On-site Communication
Through product demonstrations and technical exchanges, visitors gained a clearer understanding of chromatic confocal measurement advantages in non-contact displacement, thickness, profile, and height-difference inspection.
LightE will continue to work with equipment manufacturers and end users to support yield improvement, process control, and high-quality development across the semiconductor industry.
